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| TLP665G资料 | |
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TLP665G PDF Download |
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File Size : 116 KB
Manufacturer:TOS Description:Notes: 1. The Voltage on any input or I/O pin cannot exceed the power pin during power-up. 2. TA is the instant on case temperature. 3. See the last page of this specification for Group A subgroup testing information. 4. See the Introduction to CMOS PROMs section of the Cypress Data Book for general information on testing. 5. For devices using the synchronous enable, the device must be clocked after applying these voltages to perform this measurement. 6. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds. |
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| 1PCS | 100PCS | 1K | 10K | ||
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型 号：TLP665G 厂 家：TOS 封 装：DIP/SOP 批 号：07+ 数 量：2000 说 明：全新库存，专业TOSHIBA供应商 |
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